Ionizing Radiation Effects in MOS Oxides.pdf

Ionizing Radiation Effects in MOS Oxides

Timothy-R Oldham

This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. The last such guide was ionizing Radiation Effects in MOS Devices and Circuits, edited by Ma and Dressendorfer and published in 1989. While that book remains an authoritative reference in many areas, there has been a significant amount of more recent work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation. These same defects are also critical in many other areas of oxide reliability research. As a result of this work, the understanding of the basic physical mechanisms has evolved. This book summarizes the new work and integrates it with older work to form a coherent, unified picture. It is aimed primarily at specialists working on radiation effects and oxide reliability.

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Ionizing Radiation Effects in MOS Oxides.pdf

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Sofya Voigtuh

1.2 Overview of Radiation Effects in MOS Devices..9 1.3 TID Effects in Deep-Submicron CMOS Technologies..25 1.4 Goals and Approach..29 CHAPTER 2. MECHANISMS OF RADIATION EFFECTS IN CMOS DEVICES..32 2.1 Ionizing Radiation Damage in Deep-Submicron CMOS Technologies..32 2.2 Theory of Radiation Effects in Shallow Trench Isolation Oxides..42 2.3 Numerical Calculations of Total-ionizing-dose effects on isolation oxides in …

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Mattio Müllers

Amazon.fr - Ionizing Radiation Effects in Mos Oxides ... Noté /5. Retrouvez Ionizing Radiation Effects in Mos Oxides et des millions de livres en stock sur Amazon.fr. Achetez neuf ou d'occasion

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Noels Schulzen

This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. The last such guide was Ionizing Radiation Effects in MOS Devices and Circuits, edited by Ma and Dressendorfer and published in 1989. While that book remains an authoritative reference in many areas, there Full text of "Total Ionizing Dose Effects in MOS …

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Jason Leghmann

The last such guide was Ionizing Radiation Effects in MOS Devices and Circuits, edited by Ma and Dressendorfer and published in 1989. While that book remains an authoritative reference in many areas, there has been a significant amount of more recent work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation. These same defects are

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Jessica Kolhmann

Ionizing Radiation Effects In Mos Oxides. Author : Timothy R Oldham ISBN : 9789814496681 Genre : Science File Size : 47.54 MB Format : PDF, Docs Download : 182 Read : 688 . Download eBook. This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. The last such